OPAL-EC | Advanced Wafer-Level Edge-Coupling | EXFO
Complete PIC testing platform for precise and repeatable optical alignment and electrical probing. Preparation, automated execution
Automated Optical Inspection Systems (AOI systems)
VisionGauge® Online High-Speed Automated Optical Inspection machines are powerful, but easy to use and easy to program. Fully
Optical testing solutions for universities
Automated PIC testing fibre array) and electrical testing (DC/RF probes). The station includes a top and side vision system as well as
Optical Component Test System
A Yokogawa modular test platform with a wide selection of modules allows optimal configuration of test solutions for optical
Fully Automated Integrated Silicon Photonic Wafer Test
CM300xi - SiPh Probe Station Enables automated full wafer optical electrical characterization of various components that are used to
PIC automated probe stations
OPAL-SD - Single-die automated probe station Entry-level, flexible, cost-effective and upgradeable. Automated optical alignment and
Electro-Optical & Infrared Test Equipment
SBIR designs and manufactures the most technologically advanced infrared and electro-optical test equipment available for
OTS2000 Automated Optical Test Station – High-Precision Optical
The OTS 2000 fully characterizes the performance and quality of large optical flats — including flat panel displays, holographic
Chroma Photonics Test Solutions
These lab class instruments are often integrated into production solutions for wafer probe test, burn-in and device or module
Fully Automated Integrated Silicon Photonic Wafer Test
Ayar Labs develops monolithic optical I/O chiplets (TeraPHYTM) to enable high bandwidth, low latency, and low power consumption
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